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IEEE/ION PLANS 2010
Session A4: Sensor Manufacturing, Error Modeling & Testing
Wednesday, May 5, 2010, 2:00 p.m. – 5:30 p.m.
Session Chairs:
 |  |
| Richard Anderson Northrop Grumman | Dino Smajlovic Systron Donner Inertial |
| Title/Author | |
| 1. | Characterization of Environmental Effects and Error Modeling for Low Cost Inertial MEMS Units: Y. Yuksel, University of Calgary, Canada; A. Noureldin, University of Calgary / Queen´s University, Canada; N. El-Sheimy, University of Calgary, Canada |
| 2. | Inertial Instrument Error Identification Algorithm Based on Reverse Navigation Data: Q. Zeng, J. Liu, L. Sha, Nanjing University of Aeronautics and Astronautics, China |
| 3. | Towards Volume Medium-accuracy MEMS Gyro Manufacturing: Challenges and Solutions: O. Mezentsev, E. Frolov, M. Klimkin, D. Soloviev, A. Mezentsev, iSense LLC, Russia |
| 4. | Calibration Enhancement of ShapeAccelArray Technology for Long Term Deformation Monitoring Applications: C. Griffith, P. Dare, University of New Brunswick, Canada; J. Bond, L. Danisch, Measurand Inc., Canada |
| 5. | Analysis of Sculling Motion Errors Caused by Sensor Transfer Function Imperfections in Strapdown Inertial Navigation Systems: I. Rapoport, A. Brandes, Elbit Systems, Electro-Optics ELOP, Ltd., Israel |
| 6. | Observability of Integrated Navigation System States Under Varying Dynamic Conditions and Aiding Techniques: M. Becker, U. Bestmann, P. Hecker, Institute of Flight Guidance, Technische Universitaet Braunschweig, Germany |
| Alternate | |
| 1. | Development of a Low Cost Sun Sensor using Quad Photodiode: I. Maqsood, Masdar Institute of Science and Technology, United Arab Emirates; T. Akram, Technical University of Hamburg, Germany |
September 6, 2010 15:38 ET